Photoemission spectroscopy platform (XPS & UPS)

GINYS-ICN2-004
Guillaume Sauthier
Tècnic investigador de la Instal·lació d'Espectroscòpia de Fotoemissió
The ICN2 photoemission installation houses a state-of-the-art XPS and UPS system that allows the surface, chemical and electronic characterization of a wide range of materials. The facility provides services to both internal and external ICN2 customers. XPS and UPS are surface-sensitive techniques because electrons will travel only a few nanometers in the solid before to lose energy by inelastic interaction, meaning that the analyzed electrons come from the upper surface of the material. That is why, in photoemission spectroscopy, the sample is placed in an ultra high vacuum (UHV) to protect the surface from contamination and allow the emitted electrons from the solids to reach the analyzer. XPS, due to the higher energy of the X-ray source, gives access to the core level allowing the determination of the chemical structure of the materials as the core levels have a small chemical shift depending on the environment chemical of the atom that is ionized. XPS also allows you to quantify the elements present in the material. The UPS, due to the lower energy of UV light, gives access to the electrons of the valence bands and allows, with angular resolution UPS (ARUPS), to observe the distribution of electrons in the reciprocal space of solids.

Services

COMPATIBLE WITH SAMPLES

The samples measured at the ICN2 photoemission facilities are mainly dust, fibers and films. Liquid samples can be deposited on the appropriate substrate prior to introduction into the vacuum system.

The maximum size allowed in the sample holder is 10 mm X 10 mm.

Equipment

Photoemission spectroscopies (XPS-UPS) are a set of techniques that determine the electronic configuration of materials by analyzing the kinetic energy of electrons ejected from the material (by photoelectric effect) under X-ray irradiation (XPS) or UV light (UPS).

The XPS-UPS system in ICN2 consists of 3 UHV chambers (load blocking, preparation and analysis).

The analysis chamber is equipped with a hemispherical analyzer Phoibos 150 from SPECS with an average radius of 150 mm (total energy resolution of 2.9 meV), X-ray source with dual anode (Al Ka ​​1486.74eV and Ag La 2984.3eV) and monochromator, 4-axis manipulator Heating of samples up to 1200K for ebeam and cooling of samples for N2 (l), UV source and monochromator for He I (21.2eV) and He II (40 , 8eV) and flood gun for insulating samples.

The preparation chamber is equipped with 4-axis manipulator with sample heating up to 1200 K per ebeam, unfocused spray gun that works with Ar for sample cleaning, LEED and several CF40 ports available to install evaporators or other accessories.

Staff

Guillaume Sauthier | guillaume.sauthier@icn2.cat | 937 372 638 | ORCID | PRC Page

INSTITUTE

ICN2 - Institut Català de Nanociència i Nanotecnologia

Edifici ICN2
UAB Campus Bellaterra

08193 Cerdanyola del Vallès (Bellaterra) http://www.icn2.cat/en/

DOMAINS RIS3CAT

  • Sistema d'energia i recursos
  • Education and knowledge generation system
  • Industrial system

CATEGORIES

  • TECHNOLOGICAL EQUIPMENT
    • Spectrometry, chromatography and spectroscopy

RATES AND ACCESS

Availability Level: Medium
Access Procedures:

Open

CERCA - Ginys