Materials for Energy Labs
GINYS-IREC-003
The Materials for Energy Labs have fully equipped laboratories for the synthesis and characterization of a wide variety of materials, and for the manufacturing and testing of energy conversion and storage devices. IREC is a center of excellence in the field of energy including, among others, photovoltaic energy, electrochemical and chemical energy storage, the generation of synthetic fuels, hydrogen and fuel cells and hence, the Materials for Energy Labs provide valuable support to various academic and industrial entities of public and private nature in various fields of research and development.
Services
The services offered by the Materials for Energy Labs are:
- Deposition of bulk and thin film materials by chemical methods.
- Deposition of thin film materials by physical methods.
- Annealing chambers for the reactive synthesis and recrystallization of materials.
- Structural characterization of materials.
- Compositional characterization of materials.
- Thermal and thermoelectric characterization of materials.
- Optoelectronic characterization of materials and devices.
- Electrical, optical and opto-mechanical workshops for characterization of materials and devices.
- Combinatorial analysis platform for assessment of materials, devices and processes.
Additional specialized services:
- Battery fabrication, assembly and testing.
- Battery electrochemical testing.
- Thermo-, photo- and plasma-catalytic reactors.
- Heterogeneous catalyst characterization.
- Electrode/catalyst fabrication and thin film deposition.
- Reactor modelling (CFD).
- Synthesis of photovoltaic materials through thermal routes in a reactive atmosphere.
- Prototyping and integration of solar cells and medium size modules.
- Advanced combinatorial characterization of materials, devices and processes based on compositional, structural, optical and optoelectronic techniques.
- Optomechanical and industrial quality control and process monitoring.
- Advanced data processing based on analytical techniques and artificial intelligence.
- Electrochemical measurements and performance of devices (from micro- to stack-scale testing).
Equipment
Chemical deposition:
- Electrodeposition.
- Spin-coating.
- Screen-printing.
- Sol-gel.
- CBD and SILAR deposition.
- Ultrasonic baths.
- Hot plates with magnetic stirring.
- Substrate washing.
- UV ozone cleaner.
- Microbalances.
- Low-pressure vapor phase deposition (CVD).
- Atomic deposition systems (ALD).
Physical deposition:
- Sputtering systems with DC and RF generators.
- Thermal and electron beam evaporation system.
- Pulsed laser deposition (PLD).
Reactive synthesis and recrystallization:
- Annealing tube furnaces.
- Rapid thermal process furnaces (RTP) (80 K).
- Muffle furnaces.
Structural characterization:
- Multi-wavelength Raman-resonant/Photoluminescence
systems for the characterization and control of materials, processes and
devices, with laser excitation sources between 325 and 1064 nm compatible with
mapping up to 60×60 cm2.
- X-ray diffraction (XRD) system with low angle
diffraction for ultrathin layers, temperature and atmosphere analysis.
- Transmission electron microscope (TEM)
- Scanning electron microscope (FESEM)
- Atomic force microscope (AFM) with conductive
measurements (c-AFM).
Compositional characterization:
- Physisorption
- Chemisorption
- Thermogravimetric analysis (TGA)
- Gas Chromatography (GC)
- High Performance Liquid Chromatography (HPLC)
- X-ray Fluorescence (XRF)
- X-ray energy dispersive spectroscopy (EDX).
Thermal and thermoelectric characterization:
- Thermogravimetric analysis (TGA).
- Thermal diffusivity with Flash equipment.
- Differential scanning calorimetry (DSC).
- Seebeck coefficient.
Optical characterization:
- UV-Vis-IR spectrophotometry
- Confocal/interferometric microscope
- Ellipsometer with automatic measurement platform in
(0.6- 6 eV)
- Electrical and
electrochemical characterization:
- Kelvin resistivity probe system, Keithley I(V) source
meters.
- C-V impedance system.
- Low temperature electrical measurement station (>80
K), electroluminescence imaging system.
- Potentiostats.
- Galvanostats.
Optoelectronic characterization:
- Solar simulators (AAA class) for dark and illuminated
IV curves.
- Spectral response system for quantum efficiency
measurements.
Workshop:
- Mechanical tracer.
- Soldering station.
- Microwire bonding systems.
- Encapsulation facilities.
- Electrical and electronic design platform.
- OEM UV-VIS-NIR spectrometers.
- CCD and InGaAS detectors.
- Optomechanical modular components.
- Optical and
mechanical design software.
- 3D resin printer prototyping system.
- X-Y motorized tables and actuators.
Specialized equipment/software:
- Simultaneous electrochemical measurements with Raman
spectroscopy.
- Electrochemical measurements in operation linked to
spectroscopic ellipsometry.
- Electrochemical measurements using AFM and TERS.
- Data analysis by advanced statistical techniques and
machine learning.
- Battery fabrication equipment.
- Thermo-, photo- and plasma-catalytic reactors.
- Reactor
modelling software.
- Electrodeposition.
- Spin-coating.
- Screen-printing.
- Sol-gel.
- CBD and SILAR deposition.
- Ultrasonic baths.
- Hot plates with magnetic stirring.
- Substrate washing.
- UV ozone cleaner.
- Microbalances.
- Low-pressure vapor phase deposition (CVD).
- Atomic deposition systems (ALD).
- Sputtering systems with DC and RF generators.
- Thermal and electron beam evaporation system.
- Pulsed laser deposition (PLD).
- Annealing tube furnaces.
- Rapid thermal process furnaces (RTP) (80 K).
- Muffle furnaces.
- Multi-wavelength Raman-resonant/Photoluminescence
systems for the characterization and control of materials, processes and
devices, with laser excitation sources between 325 and 1064 nm compatible with
mapping up to 60×60 cm2. - X-ray diffraction (XRD) system with low angle
diffraction for ultrathin layers, temperature and atmosphere analysis. - Transmission electron microscope (TEM)
- Scanning electron microscope (FESEM)
- Atomic force microscope (AFM) with conductive
measurements (c-AFM).
- Physisorption
- Chemisorption
- Thermogravimetric analysis (TGA)
- Gas Chromatography (GC)
- High Performance Liquid Chromatography (HPLC)
- X-ray Fluorescence (XRF)
- X-ray energy dispersive spectroscopy (EDX).
- Thermogravimetric analysis (TGA).
- Thermal diffusivity with Flash equipment.
- Differential scanning calorimetry (DSC).
- Seebeck coefficient.
- UV-Vis-IR spectrophotometry
- Confocal/interferometric microscope
- Ellipsometer with automatic measurement platform in
(0.6- 6 eV) - Electrical and
electrochemical characterization: - Kelvin resistivity probe system, Keithley I(V) source
meters. - C-V impedance system.
- Low temperature electrical measurement station (>80
K), electroluminescence imaging system. - Potentiostats.
- Galvanostats.
- Solar simulators (AAA class) for dark and illuminated
IV curves. - Spectral response system for quantum efficiency
measurements.
- Mechanical tracer.
- Soldering station.
- Microwire bonding systems.
- Encapsulation facilities.
- Electrical and electronic design platform.
- OEM UV-VIS-NIR spectrometers.
- CCD and InGaAS detectors.
- Optomechanical modular components.
- Optical and
mechanical design software. - 3D resin printer prototyping system.
- X-Y motorized tables and actuators.
- Simultaneous electrochemical measurements with Raman
spectroscopy. - Electrochemical measurements in operation linked to
spectroscopic ellipsometry. - Electrochemical measurements using AFM and TERS.
- Data analysis by advanced statistical techniques and
machine learning. - Battery fabrication equipment.
- Thermo-, photo- and plasma-catalytic reactors.
- Reactor
modelling software.
Staff
Marti Biset Peiro | mbiset@irec.cat
| +34 933 562 615 | ORCID
Marc Nuñez Eroles | mnunez@irec.cat
| +34 933 562 615 | ORCID
Diouldé Huguette Sylla | DSylla@irec.cat
| +34 933 562 615 | ORCID
Albert Llorente Mola | allorente@irec.cat
| +34 933 562 615 | ORCID
